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Analysis of Spurious Emission and In-Band Phase Noise of an All Digital Phase Locked Loop for RF Synthesis using a Frequency Discriminator

机译:使用频率鉴别器分析所有数字锁相回路的所有数字锁相环的虚拟发射和带内相位噪声

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In almost every wireless RF application, a phase locked loop (PLL) is required. Digital signal processing especially for PLLs in CMOS technology is increasingly used instead of conventional analog processing to improve reliability, to reduce power consumption, and to allow for re-configurability. This paper presents a simulative analysis of an all digital PLL (ADPLL) with a two bit frequency discriminator (FD) in the feedback path. Effects on the in-band noise performance due to the sampling rate are treated. Furthermore, a theoretical prediction and simulative analysis of spurious emission offset frequencies will be given.
机译:在几乎所有无线RF应用程序中,需要锁相环(PLL)。尤其是CMOS技术中的PLL的数字信号处理越来越多地使用代替传统的模拟处理以提高可靠性,以降低功耗,并允许重新配置性。本文介绍了反馈路径中具有两位频率鉴别器(FD)的所有数字PLL(ADPLL)的模拟分析。对采样率引起的带内噪声性能的影响得到处理。此外,将给出对寄生发射偏移频率的理论预测和模拟分析。

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