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A SCANNING THERMAL MICROSCOPY SYSTEM WITH A TEMPERATURE DITHERING, SERVO-CONTROLLED INTERFACE CIRCUIT

机译:具有温度抖动,伺服控制接口电路的扫描热显微镜系统

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This paper describes a thermal imaging system which includes a customized micromachined thermal probe and circuit interface for a scanning microscopy instrument. The probe shank is made from polyimide for mechanical compliance and high thermal isolation, and has a thin-film metal tip of ≈50 nm in diameter. The circuit provides closed-loop control of the tip temperature and also permits it to be dithered, facilitating scanning microcalorimetry applications. This paper explains system design and optimization including both electrical and thermal analyses. Sample scans of patterned photoresist demonstrate noise-limited resolution of 29 pW/K in thermal conductance. Applications of the thermal imager extend from ULSI lithography research to biological diagnostics.
机译:本文描述了一种热成像系统,其包括用于扫描显微镜仪器的定制微机械的热探针和电路接口。探针柄由聚酰亚胺制成,用于机械顺应性和高热隔离,具有直径≈50nm的薄膜金属尖端。该电路提供尖端温度的闭环控制,并且还允许抖动,便于扫描微量微量仪应用。本文解释了系统设计和优化,包括电气和热分析。图案化光致抗蚀剂的样本扫描展示了热传导中29 pW / k的限量分辨率。热成像仪的应用从ULSI光刻研究扩展到生物诊断。

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