Symbolic Simulation Enhanced Coverage-Directed Fuzz Testing of RTL Design

摘要

With the ending of Moore’s Law and Dennard scaling, modern System-on-a-Chip (SoC) trends to incorporate a large and growing number of specialized modules for specific applications. Verification is vital to the RTL design and faces new challenges due to the growing design complexities. In this paper, we proposed a symbolic simulation enhanced coverage-directed dynamic verification technique for RTL designs. We proposed novel Full Multiplexer Toggle Coverage (FMTC) to trace and provide feedback to the verification process. The proposed method is a hybrid between symbolic simulation and mutation based fuzz testing that offsets the disadvantages of both. The achievement of high coverage is obtained by interleaved symbolic simulation and fuzz testing passes. The symbolic simulation pass is used to generate tests that direct the testing to untouched corners. While the mutation based fuzz testing pass is used to leverage test generation tasks and to enable the method to deal with large scale designs. The empirical evaluation of the method shows promising results on archiving high coverage for practical designs.