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Arbitrarily Polarized CMOS Terahertz Detector with Silicon-Based Plasmonic Antenna

机译:具有基于硅的等离子体天线的任意偏振CMOS Terahertz检测器

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摘要

In this paper, we demonstrate the idea to combine silicon-based plasmonic antennas with MOSFETs to form an arbitrarily polarized terahertz (THz) detector based on standard CMOS technology. For an optimized detector with a size of 162 µm x 161 µm, the simulation results show that the field response to the vertical polarized wave has a radio of 0.91 with 90 degree delay compared to the response to the horizontal polarized wave at 0.25 THz. The proposed arbitrarily polarized on chip detector occupies a small area size, which offers a novel approach to THz array imaging and sensing.
机译:在本文中,我们展示了将基于硅的等离子体天线与MOSFET结合的想法,以基于标准CMOS技术形成任意极化的太赫兹(THz)检测器。对于尺寸为162μm×161μm的优化检测器,模拟结果表明,与水平偏振波的响应相比,仿真结果显示对垂直极化波的磁场响应具有0.91的无线电,其与水平偏振波的响应在0.25 thz上。提出的芯片探测器任意极化占据了一个小面积大小,其提供了一种新的THz阵列成像和感测方法。

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