首页> 外文会议>China Semiconductor Technology International Conference >Circuit Reliability Evaluation of Approximate Computing
【24h】

Circuit Reliability Evaluation of Approximate Computing

机译:电路可靠性评估近似计算

获取原文
获取外文期刊封面目录资料

摘要

With the downscaling of CMOS technology, the reliability issue has become inevitable. Even in fault-tolerant applications, the effects of timing violation caused by the transistor aging are unacceptable. In the past, the traditional method to solve timing violation is to add a wide frequency guardband, which will lead to the decrease of speed. In this paper, the reliability of the approximate computing is evaluated in an image processing applications. And a method to improve circuit reliability is proposed. The results show that this method can turn critical path timing errors, which are difficult to predict and seriously hurt circuit reliability, into deterministic logic simplification errors, and thus the actual function of the circuit is not affected.
机译:随着CMOS技术的缩小,可靠性问题变得不可避免。即使在容错应用中,由晶体管老化引起的定时违规的影响也是不可接受的。在过去,解决时间违规的传统方法是添加一个宽频的卫和条带,这将导致速度的降低。本文在图像处理应用中评估了近似计算的可靠性。提出了一种提高电路可靠性的方法。结果表明,该方法可以转动临界路径定时误差,这难以预测和严重损伤电路可靠性,进入确定性逻辑简化误差,因此电路的实际功能不受影响。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号