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Analysis of Top and Bottom Contact Organic Transistor Performance for Different Technology Nodes

机译:不同技术节点的顶部和底部接触有机晶体管性能分析

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This research paper analyzes the performance of organic thin film transistor (OTFT) for two typical structures, viz., bottom gate top contact (BGTC) and bottom gate bottom contact (BGBC). The analysis is carried out for channel length (L) from 5 to 50 µm. A significant reduction in drain current for top contact is observed, however, it remains constant for the bottom contact device. Transconductance of the top contact device falls about 50% from 5 to 10 µm L, however, for bottom contact only 1% reduction is observed. Besides this, mobility in top contact is almost constant, whereas in bottom contact, mobility increases with larger channel lengths. Furthermore, total resistance decreases with higher gate bias, due to increase in carrier density within a channel and near contacts for both devices.
机译:这篇研究论文分析了有机薄膜晶体管(OTFT)在两种典型结构下的性能,即底栅顶部接触(BGTC)和底栅底部接触(BGBC)。分析通道长度(L)为5至50 µm。观察到顶部接触的漏极电流显着降低,但是,对于底部接触器件,它保持恒定。顶部接触器件的跨导从5到10 µm L下降约50%,但是,对于底部接触,仅观察到降低1%。除此之外,顶部接触中的迁移率几乎是恒定的,而底部接触中的迁移率随着通道长度的增加而增加。此外,由于两个器件的沟道内和靠近触点的载流子密度增加,总电阻随着较高的栅极偏置而减小。

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