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NITROGEN DOPED ZnO (ZnO:N) THIN FILMS DEPOSITED BY REACTIVE RF MAGNETRON SPUTTERING FOR PEC APPLICATIONS

机译:PEC应用反应性射频磁控溅射沉积氮掺杂的ZnO(ZnO:N)薄膜

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ZnO:N films were deposited by reactive RF magnetron sputtering on F-doped tin oxide coated glass substrates in mixed N_2 and O_2 gas ambient. Their PEC properties were measured and compared with those of as-deposited and annealed ZnO films. The ZnO:N films exhibit photoresponse in the visible-light region, yielding higher total photocurrents than ZnO thin films. ZnO:N thin films with reduced bandgaps were synthesized by reactive RF magnetron sputtering using ZnO target at 100°C followed by post deposition annealing at 500°C in air for 2 h. ZnO:N thin films showed enhanced N incorporation and shift of the optical absorption into the visible light regions. As a result, ZnO:N films showed improved PEC response, compared to ZnO thin films
机译:在混合的N_2和O_2气体环境中,通过反应RF磁控溅射在掺​​F的氧化锡涂层玻璃基板上沉积ZnO:N膜。测量了它们的PEC特性,并将其与沉积和退火后的ZnO薄膜的PEC特性进行了比较。 ZnO:N薄膜在可见光区域表现出光响应,比ZnO薄膜产生更高的总光电流。通过在100°C下使用ZnO靶材进行反应RF磁控溅射,然后在空气中在500°C下进行2 h后沉积退火,来合成带隙减小的ZnO:N薄膜。 ZnO:N薄膜显示出增强的N掺入和光吸收向可见光区域的转移。结果,与ZnO薄膜相比,ZnO:N薄膜显示出改善的PEC响应

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