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Towards ultra-precise optical interference filters on large area:computational and experimental optimization of the homogeneity ofmagnetron-sputtered precision optical coatings

机译:面向大面积的超精密光学干涉滤光片:均质性的计算和实验优化磁控溅射精密光学镀膜

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摘要

The optimization of the uniformity of high precision optical filters is often a critical and time consuming procedure. Thegoal of the present paper is to evaluate critical factors that influence the thickness distribution on substrates during amagnetron sputter process. A new developed sputter coater “EOSS” was used to deposit SiOsub2/sub and Nbsub2/subOsub5/sub single films andoptical filters. It is based on dynamic deposition using a rotating turntable. Two sets of cylindrical double magnetrons areused for the low and the high index layers, respectively. In contrast to common planar magnetrons, the use of cylindricalmagnetrons should yield a more stable distribution during the lifetime of the target. The thickness distribution on thesubstrates was measured by optical methods. Homogenization is carried out by shaping apertures. The distribution of theparticle flow from the cylindrical magnetron was simulated using particle-in-cell Monte Carlo plasma simulationdeveloped at Fraunhofer IST. Thickness profiles of the low index and the high index layers are calculated by numericalsimulation and will be compared with the experimental data. Experimental factors such as wobbling of the magnetronduring rotation, geometrical changes of critical components of the coater such as uniformity shapers as well as gas flowvariations will be evaluated and discussed.© (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
机译:高精度光学滤波器的均匀性的优化通常是关键且耗时的过程。本文的目标是评估影响电磁铁溅射过程中基板厚度分布的关键因素。新型溅射镀膜机“ EOSS”用于沉积SiO 2 和Nb 2 O 5 单膜和光学滤光片。它基于使用旋转转盘的动态沉积。两组圆柱双磁控管分别用于低折射率层和高折射率层。与普通的平面磁控管相反,圆柱形磁控管的使用应在靶的寿命期间产生更稳定的分布。通过光学方法测量基板上的厚度分布。均质化是通过对孔进行成形来实现的。使用Fraunhofer IST开发的单元内蒙特卡洛等离子体模拟方法,对圆柱磁控管中的颗粒流分布进行了模拟。通过数值模拟计算低折射率层和高折射率层的厚度分布,并将其与实验数据进行比较。将评估和讨论实验因素,例如磁控管在旋转过程中的摆动,镀膜机关键部件的几何变化(例如均匀成形器)以及气体流量变化。©(2012)COPYRIGHT光电仪器工程师协会(SPIE)。摘要的下载仅允许个人使用。

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