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A Density Functional Study of Ho-doped Sin (n=1-12,16, and 18) Clusters

机译:Ho掺杂的Sin(n = 1-12、16和18)团簇的密度泛函研究

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The geometric, electronic, and magnetic properties of Ho-doped Si, (n=1-12, 16, and 18) clusters are studied via the density functional theory with the generalized gradient approximation. The results show that the Ho atom in the most stable HoSin clusters always occupies the surface site. Starting from n=18, the Ho atom abruptly drops into the center of Si frame, forming the Ho-encapsulated Si cages. The stabilities of HoSiH clusters increase with increasing size n. The Ho atom in HoSin clusters enhances their chemical activities. Moreover, the magnetisms of HoSifl clusters are independent of their geometric structures, and the Si and Ho atoms are antiferromagnetic.
机译:通过具有广义梯度近似的密度泛函理论研究了Ho掺杂的Si(n = 1-12、16和18)团簇的几何,电子和磁性。结果表明,最稳定的HoSin簇中的Ho原子始终占据表面位置。从n = 18开始,Ho原子突然掉入Si框架的中心,形成Ho包封的Si笼。 HoSiH团簇的稳定性随着大小n的增加而增加。 HoSin团簇中的Ho原子增强了它们的化学活性。此外,HoSifl团簇的磁性与其几何结构无关,并且Si和Ho原子是反铁磁性的。

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