Reduction of tombstone capacitor problem by Six Sigma technique: A case study of printed circuit cable assembly line

摘要

This paper demonstrated the implementation of Six Sigma technique and DMAIC improvement methodology into a mass manufacturing of printed circuit cables. The result showed that by following the theoretical Six Sigma technique and DMAIC steps, the defects from major tombstone capacitor problem could be reduced from 1,154 DPPM to 314 DPPM and increased 1st yield output from 98.4% to 99.66%.