Radiation Characterization of Microsemi ProASIC3 Flash FPGA Family

摘要

We present radiation data, Heavy ion and proton induced Single Event Effects (SEE) and Total Ionizing Dose (TID), on the Microsemi ProASIC3 Flash Field Programmable Gate Array (FPGA) A3PE3000L. These tests have been performed in the frame of an European Space Agency (ESA) Technology Research Program (TRP).