Dielectric characterization at high temperature (1600°C) for space applications

摘要

The methods of dielectric characterization at room temperature have been well-known for 20 years. Today regarding to the needs in the aerospace field, especially for the atmospheric reentry, radioelectrical measurements performed at high temperature are very useful. This paper introduces the test mean, denoted by EPSILON 1600 in the whole document, that allows characterizations of dielectric materials from the room temperature up to 1600°C. First the principle of EPSILON 1600 is described and then some results from measurements performed on well-known materials, such as alumina, are showed.