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Size Distribution Determination of Nanoparticles and Nanosized Pores by Small-Angle X-Ray Scattering on a Multi-Purpose X-ray Diffractometer Platform

机译:多功能X射线衍射仪平台上小角X射线散射法测定纳米颗粒和纳米孔的尺寸分布

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摘要

A multi-purpose X-ray diffractometer platform was configured for small-angle X-ray scattering (SAXS) measurements. This technique was applied for nanoparticle and pore size distribution determination in nanopowders, colloidal dispersions, nanocomposites and porous materials in a range of 1-100 nm. It is extremely versatile and yields truly ensemble-averaged results from a large sample volume, does not require knowledge about the refractive index or any other physical properties, and it is applicable to crystalline and amorphous materials alike. Furthermore sample preparation is minimal. Advanced data analysis software allows to reveal complex multimodal size distributions with unrivaled resolution. Data acquisition and analysis can be automated for routine production control. The instrument platform used can be reconfigured within minutes for a multitude of complementary X-ray analytical techniques, such as powder diffraction, thin film analysis, and computed tomography.
机译:配置了多功能X射线衍射仪平台以进行小角度X射线散射(SAXS)测量。该技术用于测定1到100 nm范围内的纳米粉末,胶体分散体,纳米复合材料和多孔材料中的纳米颗粒和孔径分布。它用途广泛,可以从大量样品中获得真正的总体平均结果,不需要有关折射率或任何其他物理性质的知识,并且适用于晶体和非晶态材料。此外,样品制备最少。先进的数据分析软件可显示无与伦比的分辨率的复杂多峰尺寸分布。可以自动进行数据采集和分析,以进行常规生产控制。所使用的仪器平台可在数分钟内重新配置,以用于多种补充X射线分析技术,例如粉末衍射,薄膜分析和计算机断层扫描。

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