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Size Distribution Determination of Nanoparticles and Nanosized Pores by Small-Angle X-Ray Scattering on a Multi-Purpose X-ray Diffractometer Platform

机译:多用途X射线衍射仪平台小角X射线散射纳米颗粒和纳米尺寸的尺寸分布测定

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A multi-purpose X-ray diffractometer platform was configured for small-angle X-ray scattering (SAXS) measurements. This technique was applied for nanoparticle and pore size distribution determination in nanopowders, colloidal dispersions, nanocomposites and porous materials in a range of 1-100 nm. It is extremely versatile and yields truly ensemble-averaged results from a large sample volume, does not require knowledge about the refractive index or any other physical properties, and it is applicable to crystalline and amorphous materials alike. Furthermore sample preparation is minimal. Advanced data analysis software allows to reveal complex multimodal size distributions with unrivaled resolution. Data acquisition and analysis can be automated for routine production control. The instrument platform used can be reconfigured within minutes for a multitude of complementary X-ray analytical techniques, such as powder diffraction, thin film analysis, and computed tomography.
机译:多功能X射线衍射仪平台配置用于小角度X射线散射(SAXS)测量。纳米粉末,胶体分散体,纳米复合材料和多孔材料的纳米颗粒和孔径分布测定施用该技术,在1-100nm的范围内。它非常通用,并且产生真正的集合平均结果来自大样本体积,不需要了解折射率或任何其他物理性质的知识,并且适用于结晶和非晶材料。此外,样品制备是最小的。高级数据分析软件允许通过无与伦比的分辨率展示复杂的多模码分布。数据采集​​和分析可以自动化进行日常生产控制。所使用的仪器平台可以在几分钟内重新配置,以获得多种互补的X射线分析技术,例如粉末衍射,薄膜分析和计算机断层扫描。

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