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Design and verification of logic block circuit in an SOI-based FPGA

机译:基于SOI的FPGA中逻辑块电路的设计和验证

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A novel logic block circuit consisting of two multi-mode logic cells is proposed for the design of a tile-based FPGA fabricated with a 0.5µm SOI-CMOS logic process. Each logic cell contains two 3-LUTs. The proposed 3-LUT based logic cell circuit increases logic density by about 12% compared with a traditional 4-LUT implementation. The logic block can be used in two functional modes: LUT mode and Distributed RAM mode, the latter of which can be configured in two modes: Single-Port RAM and Dual-Port RAM. Comparing with the published data on the CLB in Xilinx Spartan FPGA, the maximum LUT logic propagation delay has about 20% improvement and the Distributed RAM average access time has about 21% improvement.
机译:提出了一种新颖的逻辑块电路,该电路由两个多模式逻辑单元组成,用于设计采用0.5μmSOI-CMOS逻辑工艺制造的基于图块的FPGA。每个逻辑单元包含两个3-LUT。与传统的4-LUT实现相比,基于3-LUT的逻辑单元电路可将逻辑密度提高约12%。逻辑块可以在两种功能模式下使用:LUT模式和分布式RAM模式,后者可以在两种模式下进行配置:单端口RAM和双端口RAM。与Xilinx Spartan FPGA中CLB上发布的数据相比,最大LUT逻辑传播延迟提高了约20%,分布式RAM平均访问时间提高了约21%。

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