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Sub-wavelength imaging from multilayer superlens

机译:多层超透镜的亚波长成像

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Multilayer superlens has been reported that it had advantages over the original single slab superlens [1]. In this work, single silver layer and Ag-SiO2 multilayer superlens devices working at wavelength of 365 nm were fabricated using standard photolithography method. Grating object with sub-wavelength resolution could be resolved through both kinds of superlens with working distance up to 128 nm. However, Ag-SiO2 multilayer superlens shows higher transmittance and image contrasts than the single silver layer one, this result verifies the theoretical results in Ref. [1].
机译:据报道,多层超透镜比原始的单平板超透镜具有优势[1]。在这项工作中,使用标准的光刻方法制造了单银层和工作在365 nm波长的Ag-SiO 2 多层超透镜器件。具有亚波长分辨率的光栅物体可以通过两种工作距离最远为128 nm的超透镜来分辨。然而,Ag-SiO 2 多层超透镜显示的透射率和图像对比度高于单个银层,这一结果验证了Ref中的理论结果。 [1]。

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