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Wave field microscope with sub-wavelength resolution and methods for processing microscopic images to detect objects with sub-wavelength dimensions
Wave field microscope with sub-wavelength resolution and methods for processing microscopic images to detect objects with sub-wavelength dimensions
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机译:具有亚波长分辨率的波场显微镜以及处理显微图像以检测具有亚波长尺寸的物体的方法
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摘要
The invention relates to a computer implemented method for processing of microscopic images to detect objects of interest, comprising:- subjecting the microscopic image to a bandpass filtering to obtain a filtered image, wherein the bandpass filtering is such as to suppress the noise and any objects which are larger than a predetermined size; and processing the filtered image at a plurality of progressively decreasing threshold levels, said processing comprising at each threshold level detecting the objects of interest using an object labelling algorithm and removing the detected objects detected at a given threshold level from the working image before proceeding to the next threshold level.Furthermore, the invention relates to a computer implemented image for processing of microscopic images of a fluorescently marked sample obtained by illuminating the sample with a structured illumination light and detecting the fluorescent light emitted from the sample.The invention relates furthermore to respective computer and microscopic systems and computer program products.
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