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Wave field microscope with sub-wavelength resolution and methods for processing microscopic images to detect objects with sub-wavelength dimensions

机译:具有亚波长分辨率的波场显微镜以及处理显微图像以检测具有亚波长尺寸的物体的方法

摘要

The invention relates to a computer implemented method for processing of microscopic images to detect objects of interest, comprising:- subjecting the microscopic image to a bandpass filtering to obtain a filtered image, wherein the bandpass filtering is such as to suppress the noise and any objects which are larger than a predetermined size; and processing the filtered image at a plurality of progressively decreasing threshold levels, said processing comprising at each threshold level detecting the objects of interest using an object labelling algorithm and removing the detected objects detected at a given threshold level from the working image before proceeding to the next threshold level.Furthermore, the invention relates to a computer implemented image for processing of microscopic images of a fluorescently marked sample obtained by illuminating the sample with a structured illumination light and detecting the fluorescent light emitted from the sample.The invention relates furthermore to respective computer and microscopic systems and computer program products.
机译:本发明涉及一种用于处理显微图像以检测感兴趣对象的计算机实现的方法,包括:-对显微图像进行带通滤波以获得滤波后的图像,其中带通滤波是为了抑制噪声和大于预定尺寸的任何物体;以及以多个逐渐降低的阈值水平处理滤波后的图像,所述处理包括在每个阈值水平使用对象标记算法检测感兴趣的对象,并在继续进行图像处理之前从工作图像中移除以给定阈值水平检测到的检测到的对象。下一个阈值水平。此外,本发明涉及一种计算机执行的图像,该图像用于处理荧光标记的样品的显微图像,该荧光标记的样品通过用结构化的照明光照射样品并检测从样品发出的荧光来获得。此外,本发明涉及相应的计算机和微观系统以及计算机程序产品。

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