首页> 外文会议>Silicon Carbide and Related Materials 2007 >Effect of the doping concentration and space of both p-grid and field limiting ring on 4H-SiC Junction Barrier Schottky diode with single ion implantation process
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Effect of the doping concentration and space of both p-grid and field limiting ring on 4H-SiC Junction Barrier Schottky diode with single ion implantation process

机译:p型栅和场限制环的掺杂浓度和空间对单离子注入工艺对4H-SiC结势垒肖特基二极管的影响

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摘要

The effect of the doping concentration and space of both p-grid and FLR on the electrical performances of 4H-SiC JBS diode has been investigated. A 4H-SiC JBS diode with the p-grid space of 3um, the FLR space of 3um, and the doping concentration of 5E18cm~(-3) showed the highest blocking voltage of 1500V.
机译:研究了p型栅和FLR的掺杂浓度和空间对4H-SiC JBS二极管电学性能的影响。一个4H-SiC JBS二极管,其p栅极间距为3um,FLR间距为3um,掺杂浓度为5E18cm〜(-3),其最高阻断电压为1500V。

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