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Gain properties of gas electron multipliers (GEMs) for space applications

机译:用于空间应用的气体电子倍增器(GEM)的增益特性

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Fine-pitch and thick-foil GEMs have been produced using a laser etching technique for photoelectric X-ray polarimeters onboard future missions. The finest hole pitch of the thick-foil GEM is 80 μm with a hole diameter of 40 μm, and a thickness of the insulator is 100 μm. The maximum effective gain in a 70%-30% mixture of argon and carbon dioxide reaches 3×10~4 at voltage of 750 V between GEM electrodes. No significant gain increase or decrease was observed during 24 hours test in which applied high voltage was ramped up and down frequently. The measured gain stability was less than 4%. An accelerated test of the high voltage ramp up and down for two years LEO operations were carried out. During the 6500 times voltage ramp up and down, the GEM kept its gain within 4% variation and no unexpected behavior was observed.
机译:细间距和厚箔状的GEM都是使用激光蚀刻技术生产的,用于未来任务中的光电X射线旋光仪。厚箔GEM的最细孔间距为80μm,孔直径为40μm,并且绝缘体的厚度为100μm。在GEM电极之间的电压为750 V时,在70%-30%的氩气和二氧化碳的混合物中,最大有效增益达到3×10〜4。在24小时测试中没有观察到明显的增益增加或减少,在该测试中,所施加的高压频繁地上升和下降。测得的增益稳定性小于4%。进行了为期两年的LEO操作的高压斜坡上升和下降的加速测试。在6500次电压上升和下降期间,GEM将其增益保持在4%的变化范围内,并且未观察到任何意外行为。

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