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The Availability of the Thermal Resistance Model in Flip-chip Packages

机译:倒装芯片封装中热阻模型的可用性

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摘要

Thermal resistance model is very simple and good tool for thermal analysis of package system. In this study, thermal resistance model was compared with simulation tool and real measurement values of flip-chip package which was made by using DTSA (Diode Temperature Sensor Array). Especially, a micro thermocouple sensor array - DTSA - has been developed to investigate the temperature distributions of underfill in flip-chip package. Various fillers were used with underfill resin system, silica, diamond, and alumina. The temperature distribution of flip-chip package was changed with various underfill system. ICEPAK simulation tool predicted the change of temperature distribution of package well and using same physical dimension, we made a thermal resistance model circuit and calculated thermal resistance values with various underfill system's thermal conductivity values which were measured with the laser flash method. Finally, measured values with DTSA was compared with ICEPAK simulated values and thermal resistance model. All three different method's thermal resistance values of maximum temperature were lay 20°C/W ~ 25°C/W. Thermal resistance model predicted the thermal resistance of DTSA flip-chip package well.
机译:热阻模型非常简单,是对封装系统进行热分析的良好工具。在这项研究中,将热阻模型与仿真工具以及使用DTSA(二极管温度传感器阵列)制成的倒装芯片封装的实际测量值进行了比较。特别是,开发了微热电偶传感器阵列DTSA,以研究倒装芯片封装中底部填充的温度分布。各种填充剂与底部填充树脂体系,二氧化硅,金刚石和氧化铝一起使用。倒装芯片封装的温度分布随各种底部填充系统而变化。 ICEPAK仿真工具使用相同的物理尺寸预测了封装孔的温度分布变化,我们制作了一个热阻模型电路,并使用激光闪光法测量了各种底部填充系统的热导率值,计算出了热阻值。最后,将DTSA的测量值与ICEPAK模拟值和热阻模型进行了比较。三种不同方法的最高温度热阻值均为20°C / W〜25°C / W。热阻模型很好地预测了DTSA倒装芯片封装的热阻。

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