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Method of detecting of thin-film coating thickness by means of 0.63-mgr; laser radiation

机译:通过0.63和MGR检测薄膜涂层厚度的方法;激光辐射

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It is described the express optical method of evaluation of thin-film coatings, deposited on metal or semiconductor surface. For the tested samples of enamel-covered duralumin it is found the linear dependence of maximal intensity and half-width of secondary radiation on the thickness of the coating.
机译:描述了沉积在金属或半导体表面上的薄膜涂层的表达光学方法。对于牙釉质覆盖的硬质蛋白的测试样品,发现最大强度和二次辐射的半宽度对涂层厚度的线性依赖性。

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