首页> 外文会议>Conference on Sensors and Smart Structures Technologies for Civil, Mechanical, and Aerospace Systems; 20060227-0302; San Diego,CA(US) >Finite element modeling and simulation of piezoelectric wafer active sensors interaction with the host structure for structural health monitoring
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Finite element modeling and simulation of piezoelectric wafer active sensors interaction with the host structure for structural health monitoring

机译:压电晶片有源传感器与主体结构相互作用的有限元建模和仿真,用于结构健康监测

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Crack detection with piezoelectric wafer active sensors (PWAS) is emerging as an effective and powerful technique in structural health monitoring (SHM). Modeling and simulation of PWAS and host structure play an important role in the SHM applications with PWAS. For decades finite element method has been extensively applied in the analysis of piezoelectric materials and structures. The advantage of finite element analysis over analytical solutions is that stress and electrical field measurements of complex geometries, and their variations throughout the device, are more readily calculated. FEM allows calculation of the stress and electric field distributions under static loads and under any applied electrical frequency, and so the effect of device geometry can be assessed and optimized without the need to manufacture and test numerous devices. Coupled field analysis taking both mechanical motions and electrical characteristics into account should all be employed to provide a systemic overview of the piezoelectric sensors/actuators (even arrays of them) and the host structures. This use of PWAS for SHM has followed two main paths: (a). Wave propagation (b). Electromechanical impedance; Previous research has shown that PWAS can detect damage using wave reflections, changes in wave signature, or changes in the electromechanical (E/M) impedance spectrum. The primary goal of this paper is to investigate the use of finite element method (FEM) to simulate various SHM methods with PWAS. For the simulation of Electro-mechanical (E/M) impedance technique, simple models, like free PWAS of different shapes and 1-dimmension beam with PWAS are investigated and the simulated structural E/M impedance was presented. For the wave propagation SHM technique, a long beam with several PWAS installed was studied. One PWAS is excited by tone burst signals and mechanical wave will propagate along the beam. The existence of a crack will affect the structure integrity and the echo reflected by crack can be observed through the simulations.
机译:压电晶片有源传感器(PWAS)的裂缝检测是一种有效而强大的结构健康监测(SHM)技术。 PWAS和主机结构的建模和仿真在带有PWAS的SHM应用程序中起着重要作用。数十年来,有限元方法已广泛应用于压电材料和结构的分析中。与分析解决方案相比,有限元分析的优势在于,可以更容易地计算出复杂几何形状的应力和电场测量值,以及它们在整个设备中的变化。 FEM允许计算静态载荷和任何施加的电频率下的应力和电场分布,因此无需制造和测试众多设备即可评估和优化设备几何形状的影响。应同时考虑机械运动和电气特性的耦合场分析,以提供压电传感器/执行器(甚至它们的阵列)和主体结构的系统概述。 PWAS用于SHM的这种使用遵循了两条主要路径:(a)。波传播(b)。机电阻抗;先前的研究表明,PWAS可以使用波反射,波特征的变化或机电(E / M)阻抗谱的变化来检测损坏。本文的主要目的是研究使用有限元方法(FEM)模拟带有PWAS的各种SHM方法。为了模拟机电(E / M)阻抗技术,研究了简单的模型,例如不同形状的自由PWAS和带有PWAS的一维光束,并给出了模拟的结构化E / M阻抗。对于波传播SHM技术,研究了安装了几个PWAS的长光束。一个PWAS被音调突发信号激发,机械波将沿着光束传播。裂纹的存在会影响结构的完整性,并且通过模拟可以观察到裂纹反射的回波。

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