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Finite element modeling and simulation of piezoelectric wafer active sensors interaction with the host structure for structural health monitoring

机译:压电晶片活性传感器与结构健康监测宿主结构相互作用的有限元建模与仿真

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Crack detection with piezoelectric wafer active sensors (PWAS) is emerging as an effective and powerful technique in structural health monitoring (SHM). Modeling and simulation of PWAS and host structure play an important role in the SHM applications with PWAS. For decades finite element method has been extensively applied in the analysis of piezoelectric materials and structures. The advantage of finite element analysis over analytical solutions is that stress and electrical field measurements of complex geometries, and their variations throughout the device, are more readily calculated. FEM allows calculation of the stress and electric field distributions under static loads and under any applied electrical frequency, and so the effect of device geometry can be assessed and optimized without the need to manufacture and test numerous devices. Coupled field analysis taking both mechanical motions and electrical characteristics into account should all be employed to provide a systemic overview of the piezoelectric sensors/actuators (even arrays of them) and the host structures. This use of PWAS for SHM has followed two main paths: (a). Wave propagation (b). Electromechanical impedance; Previous research has shown that PWAS can detect damage using wave reflections, changes in wave signature, or changes in the electromechanical (E/M) impedance spectrum. The primary goal of this paper is to investigate the use of finite element method (FEM) to simulate various SHM methods with PWAS. For the simulation of Electro-mechanical (E/M) impedance technique, simple models, like free PWAS of different shapes and 1-dimmension beam with PWAS are investigated and the simulated structural E/M impedance was presented. For the wave propagation SHM technique, a long beam with several PWAS installed was studied. One PWAS is excited by tone burst signals and mechanical wave will propagate along the beam. The existence of a crack will affect the structure integrity and the echo reflected by crack can be observed through the simulations.
机译:用压电晶片活性传感器(PWA)的裂纹检测是在结构健康监测(SHM)中的有效和强大的技术。建模和公共福利援助计划的模拟和主体结构在SHM应用与公共福利援助计划中发挥重要作用。几十年来,有限元法已在压电材料和结构的分析得到广泛应用。在分析解有限元分析的优点是,复杂的几何形状,并且在整个装置及其变化的应力和电场测量,更容易计算的。 FEM允许静态负载下和在任何压力和电场分布的计算施加的电频率,并因此器件的几何形状的影响进行评估,并且不需要制造和测试许多设备优化。耦合场分析同时服用的机械运动和电气特性考虑都应该被用来提供压电传感器/致动器(甚至它们中的阵列)和主机结构的全身性概述。这对于使用SHM的PWAS遵循两个主要途径:(a)所示。波传播(b)中。机电阻抗;以前的研究已经表明,PWAS可使用波反射,在波签名的改变,或改变在所述机电(E / M)阻抗谱检测损坏。本文的主要目标是研究使用有限元法(FEM)的模拟具有PWAS各种SHM方法。对于机电(E / M)阻抗技术,简单的模型,像不同的形状,并用PWAS 1- dimmension光束的自由PWAS的模拟进行了研究和模拟结构E / M阻抗提出。对于波传播SHM技术中,长梁与安装了几个PWAS进行了研究。一个PWAS通过音调脉冲信号和机械波激发将沿着光束传播。裂纹的存在会影响结构完整性,并且可以通过仿真来观察由裂缝反射的回波。

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