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Electrical conduction through small contact spots

机译:通过小的接触点进行导电

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摘要

Earlier literature has reported that the voltage-temperature (V-T) relation for electrical contacts, and classical electrical contact theory in general, are invalid where the a-spots are on the order of nanometers. This work reviews earlier literature dealing with the breakdown of the V-T relation and presents quantitative arguments to propose that this breakdown stems from the ballistic motion of electrons through nanometer-sized constrictions. Earlier literature also suggested that the breakdown of classical theory stems in part from thermal losses from a-spots to contaminant layers in an electrical interface. Through the use of a simple a-spot model, This work shows that this cooling mechanism is not sufficiently important to affect the validity of the classical V-T relation and classical electrical contact theory in general.
机译:较早的文献报道,电接触点的电压-温度(V-T)关系,以及一般的经典电接触理论,在a点约为纳米级的情况下是无效的。这项工作回顾了有关V-T关系破裂的早期文献,并提出了定量的论点,认为这种破裂源于电子通过纳米级收缩产生的弹道运动。较早的文献还提出,经典理论的崩溃部分是由于从a点到电界面中的污染物层的热损失。通过使用简单的a-spot模型,这项工作表明,这种冷却机制通常不足以影响经典V-T关系和经典电接触理论的有效性。

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