首页> 外文会议>Interconnect Technology Conference, 2003. Proceedings of the IEEE 2003 International >Porous dielectric dual damascene patterning issues for 65 nm node: can architecture bring a solution?
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Porous dielectric dual damascene patterning issues for 65 nm node: can architecture bring a solution?

机译:65 nm节点的多孔介电双金属镶嵌图案问题:架构能否带来解决方案?

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摘要

A dual hard mask, dual damascene architecture was developed to circumvent integration problems brought by porous ULK dielectric use. It was demonstrated that a via first strategy with adequately defined hard masks can improve patterning conditions.
机译:开发了双硬掩模,双镶嵌结构,以规避多孔ULK电介质使用带来的集成问题。事实证明,具有足够定义的硬掩模的先通孔策略可以改善构图条件。

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