indium compounds; gallium arsenide; III-V semiconductors; avalanche photodiodes; semiconductor device reliability; ageing; optical receivers; life testing; semiconductor device breakdown; reliability testing; single diffused planar APD; avalanche pho;
机译:平面InGaAs-InP雪崩光电二极管中的浮动保护环抑制扩散结外围的雪崩倍增
机译:具有浮动保护环和双扩散结的平面InP / InGaAs雪崩光电二极管
机译:无保护环的平面InP-InGaAs单增长雪崩光电二极管
机译:单散射平面Inp / Ingaas Avalanche Photodiodes的可靠性测试
机译:高速GaAsSb-InP和InGaAs-InP单向载流子光电二极管的仿真与比较
机译:InGaAs / InAlAs单光子雪崩光电二极管的理论分析
机译:1.25 GHz单光子检测,具有正弦门控Ingaas / InP雪崩光电二极管