This paper reports the results of initiating Transient Latch-Up (TLU) using a new improved trigger. The trigger produced by capacitive discharge has a high energy, under-damped bi-polar waveform similar in shape to the Machine Model (MM) but of lower voltage and frequency. High pin count parts from advanced deep submicron technologies were stimulated by combining Vcc supply pin excitation with dynamic part operation using active vectors at low clock frequency. Weak product that appears extremely robust to an over-damped uni-polar trigger was confirmed to be very susceptible to negative-going, under-damped bi-polar transients. The trigger avoids the risk of MM electrostatic discharge (ESD) damage; but combines elements of voltage over-stress, current injection, and slew rate into one stress application. The low resonant frequency will facilitate straight forward integration into very high pin count testers.
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