首页> 外文会议>Electron Devices Meeting, 1999. IEDM Technical Digest. International >Monte Carlo simulation of quantum yields exceeding unity as a probe of high-energy hole scattering rates in Si
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Monte Carlo simulation of quantum yields exceeding unity as a probe of high-energy hole scattering rates in Si

机译:量子产率超过1的蒙特卡罗模拟作为Si中高能空穴散射率的探针

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High-energy hole scattering rates for a full band Monte Carlo simulation in Si are verified using the quantum-yield experiment. We compare two models that yield the correct velocity-field and ionization coefficient characteristics but quite different energy distributions. It is demonstrated that quantum yields exceeding unity can be used as a probe of hole scattering rates in Si; the model based on ab initio impact ionization rate shows goad agreement With the experiments.
机译:使用量子产率实验验证了Si中全频带Monte Carlo模拟的高能空穴散射率。我们比较了两个模型,它们产生了正确的速度场和电离系数特性,但是能量分布却大不相同。结果表明,量子产率超过1可以用作Si中空穴散射速率的探针。从头算起电离速率的模型显示了与实验的一致性。

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