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Methods for modeling non-equilibrium degenerate statistics and quantum-confined scattering in 3D ensemble Monte Carlo transport simulations

机译:3D集成蒙特卡洛输运模拟中非平衡简并统计量和量子限制散射建模的方法

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摘要

Particle-based ensemble semi-classical Monte Carlo (MC) methods employ quantum corrections (QCs) to address quantum confinement and degenerate carrier populations to model tomorrow's ultra-scaled metal-oxide-semiconductor-field-effect-transistors. Here, we present the most complete treatment of quantum confinement and carrier degeneracy effects in a three-dimensional (3D) MC device simulator to date, and illustrate their significance through simulation of n-channel Si and Ⅲ-Ⅴ FinFETs. Original contributions include our treatment of far-from-equilibrium degenerate statistics and QC-based modeling of surface-roughness scattering, as well as considering quantum-confined phonon and ionized-impurity scattering in 3D. Typical MC simulations approximate degenerate carrier populations as Fermi distributions to model the Pauli-blocking (PB) of scattering to occupied final states. To allow for increasingly far-from-equilibrium non-Fermi carrier distributions in ultra-scaled and Ⅲ-Ⅴ devices, we instead generate the final-state occupation probabilities used for PB by sampling the local carrier populations as function of energy and energy valley. This process is aided by the use of fractional carriers or sub-carriers, which minimizes classical carrier-carrier scattering intrinsically incompatible with degenerate statistics. Quantum-confinement effects are addressed through quantum-correction potentials (QCPs) generated from coupled Schrodinger-Poisson solvers, as commonly done. However, we use these valley- and orientation-dependent QCPs not just to redistribute carriers in real space, or even among energy valleys, but also to calculate confinement-dependent phonon, ionized-impurity, and surface-roughness scattering rates. FinFET simulations are used to illustrate the contributions of each of these QCs. Collectively, these quantum effects can substantially reduce and even eliminate otherwise expected benefits of considered In_(0.53)Ga_(0.47) As FinFETs over otherwise identical Si FinFETs despite higher thermal velocities in In_(0.53)Ga_(0.47)As. It also may be possible to extend these basic uses of QCPs, however calculated, to still more computationally efficient drift-diffusion and hydro-dynamic simulations, and the basic concepts even to compact device modeling.
机译:基于粒子的集成半经典蒙特卡洛(MC)方法采用量子校正(QC)来解决量子限制和退化载流子种群的问题,从而为明天的超大规模金属氧化物半导体场效应晶体管建模。在此,我们介绍了迄今为止在三维(3D)MC器件模拟器中对量子限制和载流子简并效应的最完整处理,并通过对n沟道Si和Ⅲ-ⅤFinFET的仿真来说明它们的重要性。最初的贡献包括我们对远离平衡的简并统计数据的处理以及基于QC的表面粗糙度散射的建模,以及考虑3D中的量子约束声子和电离杂质散射。典型的MC模拟将退化的载流子群近似为费米分布,以模拟散射到最终状态的保利阻塞(PB)。为了在超规模和Ⅲ-Ⅴ类器件中实现越来越远离平衡的非费米载流子分布,我们取而代之的是根据能量和能量谷的函数对局部载流子样本进行采样,从而生成用于PB的最终状态占用概率。通过使用分数载波或子载波来辅助此过程,这可最小化与简并统计数据本质上不兼容的经典载波-载波散射。通常通过耦合Schrodinger-Poisson解算器生成的量子校正电势(QCP)解决量子约束效应。但是,我们使用这些依赖于谷和方向的QCP不仅在真实空间中甚至在能量谷之间重新分配载流子,而且还用于计算与约束有关的声子,电离杂质和表面粗糙度散射率。 FinFET仿真用于说明每个QC的贡献。总的来说,尽管In_(0.53)Ga_(0.47)As的热速度更高,但这些量子效应可以大大减少甚至消除被认为是In_(0.53)Ga_(0.47)As FinFET的预期好处,而不是其他相同的Si FinFET。也有可能将QCP的这些基本用途(无论如何计算)扩展到计算效率更高的漂移扩散和流体动力学仿真,甚至将基本概念扩展到紧凑的设备建模。

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  • 来源
    《Journal of Applied Physics》 |2016年第22期|224301.1-224301.18|共18页
  • 作者单位

    Microelectronics Research Center, The University of Texas at Austin 10100 Burnet Road, Austin, Texas 78758, USA;

    Microelectronics Research Center, The University of Texas at Austin 10100 Burnet Road, Austin, Texas 78758, USA;

    Microelectronics Research Center, The University of Texas at Austin 10100 Burnet Road, Austin, Texas 78758, USA ,Currently with Intel Corporation 2501 Northwest 229th Ave., Hillsboro, Oregon 97124, USA;

    Microelectronics Research Center, The University of Texas at Austin 10100 Burnet Road, Austin, Texas 78758, USA;

    Microelectronics Research Center, The University of Texas at Austin 10100 Burnet Road, Austin, Texas 78758, USA;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
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