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Far-end crosstalk waveform for CMOS-IC and diode loads

机译:CMOS-IC和二极管负载的远端串扰波形

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摘要

Crosstalk noise, which leads malfunction in data transmission equipment, is one of the most important problems to be solved. In this study, a CMOS-IC, a silicon diode, and a variable capacitance diode are used as nonlinear loads of microstrip lines. The waveform of the far-end crosstalk is measured and analyzed using a 4-port network model in the time domain. It is shown that the C-V characteristics of the diodes influence the waveform of the crosstalk, and that it is valid to calculate the waveform considering the capacitance of the loads to be fixed if the dependence of the capacitance upon the voltage is small.
机译:导致数据传输设备故障的串扰噪声是要解决的最重要问题之一。在这项研究中,CMOS-IC,硅二极管和可变电容二极管被用作微带线的非线性负载。远端串扰的波形在时域中使用4端口网络模型进行测量和分析。示出了二极管的C-V特性影响串扰的波形,并且如果电容对电压的依赖性小,则考虑要固定的负载的电容来计算波形是有效的。

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