首页> 外文会议>Annual review of progress in quantitative nondestructive evaluation >Microwave scattering for the characterization of a disc-shape void in dielectric materials and composites
【24h】

Microwave scattering for the characterization of a disc-shape void in dielectric materials and composites

机译:微波散射表征介电材料和复合材料中的盘状空隙

获取原文
获取外文期刊封面目录资料

摘要

Recently pulbished, experimental research on microwave NDE of an internal defect has followed either one of two approaches, each with its own adantages and drawbacks [1]. In the first (generally referred to as the far-field approach), a broad, microwave beam is launched from an antenna some distance away from the material (typically, a foot or more). The scattered signal sensed by either the same or another antenna is related to some characteristics of the defect. In the second approach, the transmitting antenna is replaced by an open-ended coaxial line or wave guide. The electromagnetic field generated in the "near-field" of this aperture is modified, when a piece of material with an internal defect is placed adjecent to it. As this "near-field" probe is mechanically scanned over the material with a defect, the resulting changes in the admittance, standing wave ratio, or the amplitude and phase of the reflected signal in the waveguide are related to the characteristics of the defect. This paper describes work using the "far-field" approach.
机译:最近,关于内部缺陷的微波NDE的试验研究遵循两种方法中的任一种,每种方法都有其自身的优点和缺点[1]。在第一种方法(通常称为远场方法)中,从与材料(通常为一英尺或更长)相距一定距离的天线发射宽广的微波束。由同一天线或另一天线检测到的散射信号与缺陷的某些特性有关。在第二种方法中,发射天线由开放式同轴线或波导代替。当将内部有缺陷的材料放置在其附近时,会改变在该孔的“近场”中产生的电磁场。当这种“近场”探针在有缺陷的材料上进行机械扫描时,导纳,驻波比或波导中反射信号的幅度和相位的最终变化与缺陷的特性有关。本文介绍了使用“远场”方法的工作。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号