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Growth of high-quality cubic GaN on (001) GaAs by halide VPE with backside buffer

机译:卤化物VPE和背面缓冲剂在(001)GaAs上生长高质量立方氮化镓

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Abstract: It is reported that arsenic (As) act as a surfactant in growth of cubic GaN by GSMBE, and that it improves quality of cubic of the grown layer. In this paper, we report that it is true for Halide Vapor Phase Epitaxy (HVPE) of GaN, however, it deteriorates photoluminescence intensity of the grown layer very much. It was found that in order to get optically high quality cubic GaN, it is important to prevent incorporation of As. The As autodoping in HVPE was suppressed by growing GaN layer on back side of the substrate, too. The photoluminescence intensity was improved by more than one order to magnitude by preventing the As autodoping. In HVPE, we can grow thick and pure GaN layers, though it is said that when the grown thickness exceeds 1.5 $mu@m, more than 10 percent hexagonal phase is introduced for gas source molecular beam epitaxy and metalorganic vapor phase epitaxy growth of cubic GaN. Best value of the cubic component for HVPE was 2 $mu@m with the cubic component of more than 99 percent. !9
机译:摘要:据报道,砷(As)在GSMBE的立方氮化镓生长中起表面活性剂的作用,并提高了生长层立方的质量。在本文中,我们报道了GaN的卤化物气相外延(HVPE)是正确的,但是,它极大地降低了生长层的光致发光强度。已经发现,为了获得光学上高质量的立方GaN,重要的是防止As的掺入。 HVPE中的As自动掺杂也可以通过在衬底背面生长GaN层来抑制。通过防止As自动掺杂,光致发光强度提高了一个数量级以上。在HVPE中,我们可以生长厚而纯的GaN层,尽管据说当生长的厚度超过1.5μm时,会引入超过10%的六方相用于气体源分子束外延和立方晶的金属有机气相外延生长氮化镓HVPE的立方组分的最佳值为2 µm @ m,立方组分的99%以上。 !9

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