Measurement of the quadratic electro-optic coefficient of lead zirconate titanate thin film by a two-beam polarization interferometer

摘要

A simple procedure is developed for the measurement of the differential quadratic electro-optic coefficient, R$-33$/, by two-beam polarization (TBP) interferometry. It is shown that a TBP interferometer can be used for measuring the Kerr coefficient of a thin film with a strong Fabry-Perot effect. The measured values of the differential effective Kerr coefficient, R$-33$/ of lead zirconate titanate 52/48 thin film lie inside the interval between $MIN@0.5 * 10$+$MIN@18$/ m$+2$//V$+2$/ and $PLU@1.7 * 10$+$MIN@18$/ m$+2$//V$+2$/ for the external DC field from $MIN@160 kV/cm to 160 kV/cm, in agreement with the known data. The correlation between differential electro-optic coefficients and field-induced birefringence is discussed.