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Tuning of large piezoelectric response in nanosheet-buffered lead zirconate titanate films on glass substrates

机译:玻璃基板上纳米片缓冲的锆钛酸铅钛薄膜中大压电响应的调谐

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摘要

Renewed interest has been witnessed in utilizing the piezoelectric response of PbZr0.52Ti0.48O3 (PZT) films on glass substrates for applications such as adaptive optics. Accordingly, new methodologies are being explored to grow well-oriented PZT thin films to harvest a large piezoelectric response. However, thin film piezoelectric response is significantly reduced compared to intrinsic response due to substrate induced clamping, even when films are well-oriented. Here, a novel method is presented to grow preferentially (100)-oriented PZT films on glass substrates by utilizing crystalline nanosheets as seed layers. Furthermore, increasing the repetition frequency up to 20 Hz during pulsed laser deposition helps to tune the film microstructure to hierarchically ordered columns that leads to reduced clamping and enhanced piezoelectric response evidenced by transmission electron microscopy and analytical calculations. A large piezoelectric coefficient of 250 pm/V is observed in optimally tuned structure which is more than two times the highest reported piezoelectric response on glass. To confirm that the clamping compromises the piezoelectric response, denser films are deposited using a lower repetition frequency and a BiFeO3 buffer layer resulting in significantly reduced piezoelectric responses. This paper demonstrates a novel method for PZT integration on glass substrates without compromising the large piezoelectric response.
机译:在玻璃基板上利用PbZr0.52Ti0.48O3(PZT)膜的压电响应,将其应用于自适应光学等方面,引起了人们的新兴趣。因此,正在探索新的方法来生长取向良好的PZT薄膜,以收获大的压电响应。然而,即使由于薄膜取向良好,与衬底引起的夹持相比,薄膜压电响应也比固有响应显着降低。在这里,提出了一种新的方法,通过利用晶体纳米片作为种子层,在玻璃基板上优先生长(100)取向的PZT膜。此外,在脉冲激光沉积过程中,将重复频率提高至20 Hz有助于将膜的微结构调整为分层的列,从而减少了夹持,并通过透射电子显微镜和分析计算证明了压电响应的增强。在最佳调谐结构中观察到250 pm / V的大压电系数,是玻璃上最高压电响应的两倍以上。为了确认钳位影响了压电响应,使用较低的重复频率和BiFeO3缓冲层沉积了致密的薄膜,从而导致压电响应大大降低。本文演示了一种在不损害大压电响应的情况下在玻璃基板上进行PZT集成的新方法。

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