首页> 外文会议>Conference on three-dimensional imaging, optical metrology, and inspection >Acquiring even striped patterns intensity in three-dimensional shape measurement system using an optical modulator
【24h】

Acquiring even striped patterns intensity in three-dimensional shape measurement system using an optical modulator

机译:使用光调制器获取三维形状测量系统中的甚至条纹图案强度

获取原文

摘要

We have continued research on our three-dimensional shape measurement system, using spatial projections of light variation patterns. This method is non-contact, non-invasive, and completes measurement in a short time. However, light diffusion influence on the measurable accuracy. We proposed a method using differentiation to enhance accuracy of measurement, and were successful in achieving this goal. Moreover, the measurable area was expanded. Since our method involves computational manipulation of the data obtained by the original system, it requires no additional equipment. It is a very practical and effective method.
机译:我们使用光变化模式的空间投影继续研究我们的三维形状测量系统。该方法是非接触,非侵入性的,在短时间内完成测量。然而,光扩散对可测量的准确性影响。我们提出了一种使用差异化以提高测量准确性的方法,并且成功地实现了这一目标。此外,可测量的区域被扩展。由于我们的方法涉及由原始系统获得的数据的计算操纵,因此它不需要额外的设备。这是一种非常实用且有效的方法。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号