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Test results of a factory calibration technique for nonuniformity correction of an InSb infrared system

机译:用于InSb红外系统不均匀校正的工厂校准技术的测试结果

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Abstract: Residual fixed pattern noise (RFPN) is a strong system performance driver for missile seekers using infrared focal plane arrays (IRFPA). RFPN is a result of variations in response from detector to detector in an IRFPA given a uniform input flux. This issue is further complicated by the need for reasonable correction methods for a fielded system where blackbody sources would not be available. One means of correcting a fielded system is to determine and store gains at the factory, and collect a one point offset correction in the field. For this method to be viable, gains must be stable through time. This paper presents test results for a multi-point piecewise linear correction technique using stored gains with offsets being collected just prior to correction. Data on gain stability over time and FPA temperature are presented. Results are also presented for a linear correction technique used at various FPA temperatures between approximately 77.9 to 88.1 degrees Kelvin.!5
机译:摘要:残余固定模式噪声(RFPN)是使用红外焦平面阵列(IRFPA)的导弹搜寻器的强大系统性能驱动器。 RFPN是在给定均匀输入通量的情况下,IRFPA中检测器之间响应变化的结果。对于无法获得黑体源的现场系统,需要一种合理的校正方法,这使问题变得更加复杂。校正现场系统的一种方法是在工厂确定并存储增益,并在现场收集单点偏移校正。为了使该方法可行,增益必须随着时间的推移而保持稳定。本文介绍了一种多点分段线性校正技术的测试结果,该技术使用了存储的增益,并且在校正之前就已收集了偏移量。给出了有关随时间和FPA温度的增益稳定性的数据。还给出了在大约77.9至88.1开氏度之间的各种FPA温度下使用的线性校正技术的结果。5

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