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HgCdTe- an unexpectedly good choice for (NEAR) room temperature focal plane arrays

机译:HgCdTe-(NEAR)室温焦平面阵列出乎意料的好选择

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Fueled by a broad range of government needs and funding, HgCdTe materials and device technology has matured significantly over th last two decades. Also in this same time period, we have come to understand better the phenomenology which limits imager performance. As a result of these developments, it appears that HgCdTe arrays may be tailored in wavelength to outperform GaAs-based image intensifier devices in sensitivity and to compete with bolometric and pyroelectric imaging arrays in NEDT at temperatures at or near room temperature (250 K- 295 K). These benefits can be fully realized, however, only if HgCdTe can be brought to a level of maturity where the material and detectors made from it are limited by fundamental mechanisms. We will discuss the state of HgCdTe near room temperature performance and the practical and theoretical limits which constrain it.
机译:在广泛的政府需求和资金支持下,HgCdTe材料和设备技术在过去的二十年中已显着成熟。同样在同一时间段内,我们已经更好地理解了限制成像器性能的现象学。这些进展的结果表明,HgCdTe阵列的波长可以定制,以在灵敏度方面优于基于GaAs的图像增强器设备,并在室温或接近室温的温度下与NEDT中的辐射热成像和热释电成像阵列竞争(250 K-295) K)。但是,只有将HgCdTe达到一定的成熟水平,并且其材料和检测器受到基本机制的限制,才能充分实现这些益处。我们将讨论室温下HgCdTe的状态以及限制它的实践和理论极限。

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