Laser beam induced current (LBIC) spatial imaging as a characterization tool for infrared HgCdTe materials and devices

摘要

Abstract: In this paper, the laser beam induced current (LBIC) technique is applied to the study of HgCdTe infrared materials and devices. In particular, a new quantitative model that relates the LBIC signal to photodiode device parameters is fitted to experimental data obtained from a mid-wavelength infrared (MWIR) HgCdTe photodiode. In addition, the LBIC technique is used to map and identify electrically active defect structures resulting from a novel HgCdTe passivation process in which thermally deposited ZnS is subsequently anodized in a non- aqueous sodium sulphide solution. !4