Abstract: Described are the two frontier areas of interest, that is, the measurement of refractive index distribution in gradient index glasses and the precise evaluation and measurement of optical surfaces for high precision optics. Scanning total reflection method and interferometric methods are applied to the refractive index measurement with an accuracy of 10$+$MIN@4$/ to 10$+$MIN@5$/. An AFM is found very useful for the evaluation of non-conductive surfaces as well as multilayers for x-ray optics. Methods for absolute measurement of surface profiles are proposed in consideration of the deformation due to gravity and another method for large surfaces.!11
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机译：摘要：描述了两个有趣的前沿领域，即梯度折射率玻璃中折射率分布的测量以及高精度光学器件的光学表面的精确评估和测量。扫描全反射法和干涉法用于折射率测量，精度为10 $ + $ MIN @ 4 $ /至10 $ + $ MIN @ 5 $ /。人们发现，原子力显微镜对评估非导电表面以及X射线光学器件的多层结构非常有用。考虑到重力引起的变形，提出了一种用于绝对测量表面轮廓的方法，以及针对大表面的另一种方法。11
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