首页> 外文会议>Optoelectronic Integrated Circuit Materials, Physics, and Devices >Design fabrication and modeling of high-speed metal-semiconductor-metal (MSM) photodetectors with indium-tin-oxide (ITO) and Ti/Pt/Au contacts
【24h】

Design fabrication and modeling of high-speed metal-semiconductor-metal (MSM) photodetectors with indium-tin-oxide (ITO) and Ti/Pt/Au contacts

机译:具有氧化铟锡(ITO)和Ti / Pt / Au触点的高速金属半导体金属(MSM)光电探测器的设计制造和建模

获取原文

摘要

Abstract: Metal-semiconductor-metal photodetectors have been fabricated on undoped epitaxial GaAs material with gold and indium-tin-oxide interdigitated contacts. In both cases, various electrode configurations were laid out with combinations of finger spacings and finger widths ranging from 1 to 3 $mu@m and detector cross-sections of 25 $MUL 25, 50 $MUL 50 and 100 $MUL 100 $mu@m$+2$/. Frequency response measurements were carried out up to 20 GHz using a high-speed electro-optic modulator combined with a DC-operated laser diode and an ultrafast photodetector for system calibration. This frequency domain technique ensures accurate measurement of true analog bandwidth compared to time-domain techniques which can easily lead to an overestimation of photodetector bandwidth. Photodetector responsivity has been plotted as a function of bias voltage. We note that for similar devices, Ti/Pt/Au contact MSMs require lower bias voltages before they reach their saturation bandwidth than ITO contact MSMs. For a 100 $MUL 100 $mu@m$+2$/ ITO MSM with a 2 $mu@m finger width and a 2 $mu@m finger spacing, the 3 dB bandwidth was measured to be 4 GHz at 10 V bias. By comparison, similar gold contact MSMs exhibit 3 dB bandwidths in excess of 12 GHz. The difference in speed is partly explained by the higher device parasitics of the ITO MSMs, as confirmed by S$-11$/ measurements made on both types of device. The S$-11$/ data was also used to extract the MSM equivalent circuit parameters for a high-frequency MSM model. Similar measurements on other electrode configurations show that as expected, the speed of ITO MSMs become considerably higher as device size is decreased, until the limit where transmit-time effects start to dominate the overall performance.!8
机译:摘要:金属-半导体-金属光电探测器是在未掺杂的外延GaAs材料上制成的,具有金和铟锡氧化物的叉指触点。在这两种情况下,都以手指间距和手指宽度从1到3 $μm的组合以及检测器横截面25 $ MUL 25、50 $ MUL 50和100 $ MUL 100 $ mu @的组合布置了各种电极配置m $ + 2 $ /。使用高速电光调制器与直流操作的激光二极管和用于系统校准的超快光电检测器相结合,可在高达20 GHz的频率下进行频率响应测量。与时域技术相比,这种频域技术可确保对真实模拟带宽的准确测量,而时域技术很容易导致光电检测器带宽的高估。光电探测器的响应度已绘制为偏置电压的函数。我们注意到,对于类似的器件,Ti / Pt / Au接触MSM与ITO接触MSM相比,在达到饱和带宽之前需要更低的偏置电压。对于手指宽度为2 $ mu @ m,手指间距为2 $ mu @ m的100 $ MUL 100 $ mu @ m $ + 2 $ / ITO MSM,在10 V偏置下测得的3 dB带宽为4 GHz 。相比之下,类似的金触点MSM表现出超过12 GHz的3 dB带宽。速度差异的部分原因是ITO MSM的更高的器件寄生性,这在两种类型的器件上进行的S $ -11 $ /测量都得到了证实。 S $ -11 $ /数据还用于提取高频MSM模型的MSM等效电路参数。对其他电极配置的类似测量结果表明,正如预期的那样,随着设备尺寸的减小,ITO MSM的速度变得相当高,直到传输时间效应开始主导整体性能的极限为止!8

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号