首页> 外文会议>Indium Phosphide and Related Materials, 1991., Third International Conference. >Effect of structural parameters on InGaAs/InAlAs 2DEG characteristics
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Effect of structural parameters on InGaAs/InAlAs 2DEG characteristics

机译:结构参数对InGaAs / InAlAs 2DEG特性的影响

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It is shown that superlattices or very thick buffer layers are not necessary to achieve high mobility in InGaAs/InAlAs 2DEG structures. However, an InAlAs buffer is required to prevent the formation of a sheet charge at the back interface of the InGaAs channel when it is grown directly on InP heated in an As flux. It is found that bulk InAlAs is not characterized by persistent photoconductivity (PPC) or carrier freezeout and that the transport properties of the two-dimensional electron gas (2DEG) structures are must less affected by cooling and illumination than comparable AlGaAs/GaAs structures.
机译:结果表明,在InGaAs / InAlAs 2DEG结构中实现高迁移率不需要超晶格或非常厚的缓冲层。但是,当直接在以As助熔剂加热的InP上生长InGaAs通道时,需要使用InAlAs缓冲液来防止在InGaAs通道的后界面形成薄层电荷。已发现,大块InAlAs的特征不在于持久的光电导(PPC)或载流子冻结,而且与可比的AlGaAs / GaAs结构相比,二维电子气(2DEG)结构的传输特性受冷却和光照的影响也必须小。

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