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On meta-obfuscation of physical layouts to conceal design characteristics

机译:关于物理布局的荟萃混淆隐藏设计特征

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Intellectual property theft by reverse engineering leads to loss of revenue and threatens security of integrated circuits. A number of design obfuscation techniques been proposed to counter IC reverse engineering. Most such techniques rely on functional misdirection at gate or module level but, do not prevent leakage of visual information about design characteristics from the physical layout. For example, capitalizing on relative difference in sizes among various functional units and their pin counts, an attacker may still be able to hypothesize about function of a unit, irrespective of any obfuscation performed on them. Hence, we propose meta-obfuscation techniques to harden other obfuscation mechanisms against physical information leakage. Our aim is to add complexity in the visual domain so that the physical characteristics of a design do not have notable correlation to its functionality. We explore various metrics to quantify the quality of the proposed meta-obfuscation and apply them in design automation. Experimental results show improvement in metrics used and also, highlight relevant overheads for meta-obfuscation.
机译:通过逆向工程盗窃知识产权盗窃导致收入损失并威胁到集成电路的安全性。提出了许多设计混淆技术来抵消IC逆向工程。大多数此类技术依赖于门或模块水平的功能误导,但是,不要防止有关物理布局的设计特征的视觉信息泄漏。例如,利用各种功能单元之间的大小的相对差异及其引脚计数,攻击者仍然可以能够假设单元的功能,而不管对它们执行的任何混淆。因此,我们提出了元混淆技术来硬化其他混淆机制免于物理信息泄漏。我们的目标是在视觉域中增加复杂性,以使设计的物理特性与其功能没有显着相关性。我们探索各种指标,以量化所提出的元混淆的质量,并在设计自动化中应用它们。实验结果表明,使用的指标的改进以及突出了元混淆的相关开销。

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