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Detecting intermittent resistive faults in digital CMOS circuits

机译:检测数字CMOS电路中间歇电阻故障

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摘要

Interconnection reliability threats dependability of highly critical electronic systems. One of most challenging interconnection-induced reliability threats are intermittent resistive faults (IRFs). The occurrence rate of this kind of defects can take e.g. one month, and the duration of defects can be as short as a few nanoseconds. As a result, evoking and detecting these faults is a big challenge. IRFs can cause timing deviations in data paths in digital systems during its operating time. This paper proposes an online digital slack monitor which is able to detect small timing deviations caused by IRFs in digital systems. The simulation results show that the proposed monitor is effective in detecting IRFs.
机译:互连可靠性威胁高度关键电子系统的可靠性。最具挑战性的互联诱导的可靠性威胁之一是间歇性电阻故障(IRFS)。这种缺陷的发生率可能需要。一个月,缺陷的持续时间可以像几个纳秒一样短。结果,唤起和检测这些故障是一个很大的挑战。 IRFS可以在操作时间内导致数字系统数据路径中的定时偏差。本文提出了一种在线数字松弛监视器,能够检测数字系统中IRFS引起的小定时偏差。仿真结果表明,所提出的监视器有效地检测IRF。

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