Worst-Case Coupled Voltage Analysis of Printed Circuit Board Traces

摘要

A detailed worst-case coupled voltage study on various printed circuit board (PCB) trace shapes has been carried out. Different trace lengths and trace shapes have been considered to explore the response from worst-case coupled voltage under external electromagnetic field. As a first step, the coupled voltage to loads of a straight PCB trace is analytically calculated and compared with existing full-wave electromagnetic (EM) solver over a particular frequency spectrum. The worst-case coupled voltage, which is derived using the Parseval’s theorem averages out the frequency dependent coupled voltage for a certain trace length. The final comparative results indicate that a specific PCB trace shape couples less to EM field irrespective of its length.