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Deposition of Optically Transparent Copper Films on Dielectric Substrates Using the Plasma Focus Installation

机译:使用等离子聚焦装置在电介质基底上沉积光学透明的铜膜

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Thin optically transparent homogeneous copper films on silicate glass substrates (size ~ 35×35 mm) were obtained at the Plasma focus facility (PF-4, LPI). The films were obtained by deposition from “metal plasma” formed during ablation of the copper anode of the PF installation. The films were deposited in the atmosphere of the plasma-forming gas argon at a pressure of ~ 1 Torr. The film uniformity was controlled by measuring the transmission spectrum in the middle and at the edge of the glass plate and was ~ 10%. Transmission spectra of films on glass substrates were measured in the range of 0.3-1.0 µ at temperature 300K. The transmission spectrum of Cu films is mainly determined by light scattering on small particles < 0.3 µ. Good adhesion of films is due to the formation of a transition layer on the surface of glass plates. Depending on the number of plasma pulses optical copper films were obtained as dielectric and also electrically conductive.
机译:在等离子聚焦设备(PF-4,LPI)上,在硅酸盐玻璃基板(尺寸约为35×35 mm)上获得了光学透明的均匀铜薄膜。薄膜是通过在PF设备的铜阳极烧蚀过程中形成的“金属等离子体”沉积而获得的。在〜1Torr的压力下将膜沉积在等离子体气体氩气中。通过测量玻璃板的中部和边缘处的透射光谱来控制膜的均匀度,该均匀度为〜10%。在温度为300K时,在0.3-1.0 µ范围内测量了玻璃基板上薄膜的透射光谱。 Cu膜的透射光谱主要由在<0.3 µm的小颗粒上的光散射确定。薄膜的良好附着力是由于在玻璃板表面上形成了过渡层。根据等离子脉冲的数量,获得光学铜膜作为电介质并且还导电。

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