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Cohesive Zone Modeling and Damage Prediction of Interfacial Delamination in Potted Electronics Subjected to High-G Mechanical Shock

机译:受到高G机械冲击的盆栽电子中界面分层的粘结区建模和损伤预测

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Surface mount electronic components reinforced with underfills and epoxy potting have shown to increase the survivability expectations under extreme mechanical loading. Additional structural support and shock damping are provided by potting. Electronic components are also potted to protect sensitive equipment from environmental conditions (such as moisture), as well as to insulate electrical leads in the event at other components fail. Potting of electronics has become one of the most viable and cost-effective solutions to enhance electronic package survivability. At extreme mechanical shock loads, the electronic components undergo tremendous strain which in turn is responsible for solder joint failure in BGA components. Due to the bulk of material surrounding the PCB, potting and encapsulation resins are commonly two-part systems which when mixed together form a solid, fully-cured material, with no by-products. The cured potting materials are prone to interfacial delamination under dynamic shock loading which in turn potentially cause failures in the package interconnects. The study of interfacial fracture resistance in PCB/epoxy potting systems under dynamic shock loading is important in mitigating the risk of system failure in mission-critical applications. In this paper, we focus on the mechanics of the interface delamination of the epoxy potted PCB assembly. A finite element model framework was developed for a circular PCB with fine pitch BGA packages which are encapsulated with potting material. The interface between the PCB and the potting compound was modeled using cohesive zone elements. Damage is assumed to occur at interfaces modeled in the material, while the bulk material is assumed to be linear elastic. The damage initiation and progression were defined by the traction-separation law. The test assembly model was subjected to high-g mechanical shock loads up to 25,000g. The board strains and displacement from the dynamic explicit model was correlated with the findings from the DIC results of the actual stress test. The damage accumulation versus the number of drops and survivability of the components as a function of damage progression has been reported and compared with the fracture characteristics of the cohesive zone constitutive law.
机译:已证明,用底部填充胶和环氧树脂灌封增强的表面安装电子元件可以提高在极端机械负载下的生存能力预期。灌封可提供额外的结构支撑和减震功能。电子元件也要灌封,以保护敏感设备免受环境条件(例如湿气)的影响,并在其他元件发生故障的情况下对电线进行绝缘。电子灌封已成为增强电子封装生存能力的最可行和最具成本效益的解决方案之一。在极端的机械冲击载荷下,电子组件承受巨大的应变,这又是导致BGA组件中的焊点失效的原因。由于PCB周围的材料很多,因此灌封和封装树脂通常是两部分的系统,当混合在一起时会形成固体,完全固化的材料,而不会产生副产品。固化的灌封材料在动态冲击载荷下容易发生界面分层,从而潜在地导致封装互连故障。在动态冲击载荷下研究PCB /环氧树脂灌封系统中的界面断裂阻力对于降低关键任务应用中系统故障的风险非常重要。在本文中,我们专注于环氧树脂封装的PCB组件的界面分层机制。为带有细间距BGA封装并用灌封材料封装的圆形PCB开发了有限元模型框架。 PCB和灌封料之间的界面使用内聚区元素进行建模。假定损坏发生在材料建模的界面上,而散装材料则假定为线性弹性。损伤的发生和发展由牵引分离定律确定。测试装配模型承受了高达25,000g的高g机械冲击载荷。动态显式模型的板应变和位移与实际应力测试的DIC结果相关。已经报道了损伤累积相对于组件的下落数和组件的生存能力作为损伤进展的函数,并将其与内聚区本构关系的断裂特征进行了比较。

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