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A Low Noise Fault Tolerant Radiation Hardened 2.56 Gbps Clock-Data Recovery Circuit with High Speed Feed Forward Correction in 65 nm CMOS

机译:具有65 nm CMOS的高速前馈校正的低噪声容错辐射硬化2.56 Gbps时钟数据恢复电路

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摘要

A fault tolerant, radiation hardened Clock and Data Recovery (CDR) architecture is presented for high-energy physics and space applications. The CDR employs a novel soft-error tolerant Voltage Controlled Oscillator (VCO) and includes a high-speed feed-forward path to stabilize the CDR to compensate for an additional pole in the VCO to harden it against ionizing particles. The CDR has a data rate of 2.56 Gbps and uses In-Phase/Quadrature (IQ) clocks in combination with a frequency detector (FD) to increase the pull-in range. The circuit was designed in a 65 nm CMOS technology and has a core power consumption of only 34 mW.
机译:提出了一种用于高能物理和太空应用的容错,防辐射的时钟和数据恢复(CDR)架构。 CDR采用了一种新型的软容错压控振荡器(VCO),并包括一个高速前馈路径以稳定CDR,以补偿VCO中的另一个极点,以使其硬化以抵抗电离粒子。 CDR的数据速率为2.56 Gbps,并使用同相/正交(IQ)时钟以及频率检测器(FD)来增加引入范围。该电路采用65 nm CMOS技术设计,核心功耗仅为34 mW。

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