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Reliability of Sintered and Soldered High Power Chip Size Packages and Flip Chip LEDs

机译:烧结和焊接的高功率芯片尺寸封装和倒装芯片LED的可靠性

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For automotive exterior lighting application high luminance light sources are required, i.e. high current density. The interconnect between LED and board needs to have a high thermo-mechanical fatigue resistance. Silver and copper sintering was investigated as a replacement for SnAgCu (SAC) solder joints. Sinter processes with and without pressure were applied. For process development and reliability investigation the interconnects were analyzed by X-Ray (area and homogeneity of interconnect) and transient thermal analysis TTA (integrity of joint between LED and board). For development of the sinter processes, as reference, also 1 mm2thin film dies (TF-LEDs) were used. Silver sintering under pressure revealed as expected high thermal and mechanical performance. Pressureless Ag sintered joints showed not as good but promising results. Printing and drying conditions have a major impact on the quality of the sinter joint, in especially for the FC-LEDs. For the FC-LEDs best thermal resistance mean value of 8.5 K/W is observed for silver sintering under pressure and a mean shear strength of 64 MPa in comparison to the reference SAC solder (8.5 K/W and 68 MPa). For copper sintering no stable process was achieved. The main reason was due to only partial reduction (under formic acid enriched nitrogen) of the copper paste during the sintering process. The reliability of the soldered LED interconnects using different solders, i.e. SAC305, SnBiAg, Indium and an improved SAC+ solder, was investigated by accelerated stress testing. The LEDs are placed in a temperature shock chamber and the joint quality, i.e. crack formation, is measured after 100/500/750/1000 cycles by TTA. The degradation of the thermal properties of the joints is monitored. The reliability data are presented and discussed in the paper.
机译:对于汽车外部照明应用,需要高亮度光源,即高电流密度。 LED和板之间的互连必须具有较高的热机械疲劳强度。对银和铜烧结进行了研究,以替代SnAgCu(SAC)焊点。施加有压力和无压力的烧结工艺。为了进行工艺开发和可靠性研究,通过X射线(互连的面积和均匀性)和瞬态热分析TTA(LED和电路板之间的连接完整性)来分析互连。对于烧结工艺的发展,作为参考,也为1 mm 2 使用了薄膜模具(TF-LED)。在压力下进行银烧结显示出预期的高热和机械性能。无压Ag烧结接头表现不佳,但有希望的结果。印刷和干燥条件对烧结接头的质量有重大影响,尤其是对于FC-LED。对于FC-LED,与参考SAC焊料(8.5 K / W和68 MPa)相比,在压力下进行银烧结观察到的最佳热阻平均值为8.5 K / W,平均剪切强度为64 MPa。对于铜烧结,没有实现稳定的过程。主要原因是由于在烧结过程中铜浆仅部分还原(在富含甲酸的氮气下)。通过加速应力测试,研究了使用不同焊料(即SAC305,SnBiAg,铟和改进的SAC +焊料)的LED互连LED的可靠性。将LED放置在温度冲击室中,并在100/500/750/1000次循环后通过TTA测量接头质量,即裂纹形成。监测接头热性能的下降。本文介绍并讨论了可靠性数据。

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