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Improving the robustness and drift resilience of CMOS BBPLL-based time-based sensor interfaces

机译:提高基于CMOS BBPLL的基于时间的传感器接口的鲁棒性和漂移弹性

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Robustness against all variations in power supply, temperature, drift over time, and so on, are extremely important for many of the emerging smart and autonomous applications. An overview is presented of the inherent robustness properties and the design techniques applied to improve the robustness of CMOS time-based sensor interfaces using BBPLL-based architectures. This is illustrated by means of two application cases: 1) a BBPLL-based capacitive sensor interface that achieves 14-bit resolution using the time-based chopping technique to reduce the effect of 1/f noise; and 2) a fully-differential BBPLL-based resistive-bridge sensor interface that has a very high drift resilience by combining several digitally-assisted design techniques, such as oscillator tuning. The demonstrated robustness together with the small chip area and technology scalability proves that this architecture is very suited for sensing applications.
机译:对于许多新兴的智能和自主应用程序而言,针对电源,温度,随时间变化的漂移等所有方面的稳健性极为重要。概述了固有的鲁棒性和设计技术,这些技术可用于使用基于BBPLL的体系结构来提高CMOS基于时间的传感器接口的鲁棒性。这通过两个应用案例进行说明:1)基于BBPLL的电容式传感器接口,该接口使用基于时间的斩波技术来降低14 / f噪声的影响,可实现14位分辨率; 2)基于全差分BBPLL的电阻桥传感器接口,通过结合几种数字辅助设计技术(例如振荡器调谐),具有很高的漂移弹性。所展示的鲁棒性,较小的芯片面积和技术可扩展性证明了该架构非常适合于传感应用。

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