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首页> 外文期刊>Microelectronics reliability >ANN based CMOS ASIC design for improved temperature-drift compensation of piezoresistive micro-machined high resolution pressure sensor
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ANN based CMOS ASIC design for improved temperature-drift compensation of piezoresistive micro-machined high resolution pressure sensor

机译:基于ANN的CMOS ASIC设计可改善压阻微加工高分辨率压力传感器的温度漂移补偿

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摘要

The paper investigates the temperature-drift compensation of a high resolution piezoresistive pressure sensor using ANN based on conventional neuron model as also the inverse delayed function model of neuron. Using the delayed neuron model, an improvement in temperature-drift compensation has been obtained compared to the conventional neuron model. The CMOS analog ASIC design of a feed forward neural network using the inverse delayed function model of self connectionless neuron for the precise temperature-drift compensation has been presented. The inverse tan-sigmoid function is realized in CMOS implementation by Gilbert multiplier, differential adder and a cubing circuit. The entire design of the circuit has been done using AMS 0.35 μm CMOS model and simulated using Mentor Graphics ELDO simulator. Using the inverse delayed function model of neuron a mean square error of the order of 10~(-7) of the neural network has been obtained against a mean square error of the order of 10~(-3) using conventional neuron model for the same architecture of ANN. This brings down the error from 9% for uncompen-sated sensor to 0.1% only for compensated sensor using the delayed model of neuron in the temperature range of 0-70℃. Using conventional neuron based ANN compensation, the error is reduced to 1% error.
机译:本文研究了基于常规神经元模型以及神经元的逆延迟函数模型的基于ANN的高分辨率压阻压力传感器的温度漂移补偿。与传统的神经元模型相比,使用延迟的神经元模型,可以获得温度漂移补偿的改进。提出了一种前馈神经网络的CMOS模拟ASIC设计,该设计使用自连接神经元的逆延迟函数模型进行精确的温度漂移补偿。 tan形反S函数在CMOS实现中由吉尔伯特乘法器,差分加法器和计数电路实现。电路的整个设计已使用AMS 0.35μmCMOS模型完成,并使用Mentor Graphics ELDO模拟器进行了仿真。使用神经元的逆延迟函数模型,获得了神经网络的10〜(-7)数量级的均方误差,而使用传统的神经元模型获得了10〜(-3)数量级的均方误差。与ANN的架构相同。使用0-70℃温度范围内的神经元延迟模型,将误差从非补偿传感器的9%降低到仅补偿传感器的0.1%。使用常规的基于神经元的ANN补偿,误差可减少到1%。

著录项

  • 来源
    《Microelectronics reliability》 |2010年第2期|282-291|共10页
  • 作者单位

    IC Design and Fabrication Centre, Department of Electronics and Telecommunication Engineering, Jadavpur University, Kolkata 700 032, India;

    IC Design and Fabrication Centre, Department of Electronics and Telecommunication Engineering, Jadavpur University, Kolkata 700 032, India;

    Dept. of Electronics and Telecommunication Engg., Bengal Engineering and Science University, Shibpur, Howrah 711 103, India;

    rnIC Design and Fabrication Centre, Department of Electronics and Telecommunication Engineering, Jadavpur University, Kolkata 700 032, India;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);
  • 原文格式 PDF
  • 正文语种 eng
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